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Retrieving the energy-loss function from VEELS

version 1.0.2 (14.7 KB) by Qingping Meng
The retardation and surface effect can been removed if the thickness of sample is known.


Updated 5 Nov 2020

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With recent rapid advancement in electron microscopy instrumentation, in particular, bright electron sources and monochromators, valence electron energy-loss spectroscopy (VEELS) has become attractive for retrieving band structures, optical properties, dielectric functions and phonon information of materials. However, Cherenkov radiation and surface-loss contribution significantly alter fine structures of VEELS, even in simple semiconductors and insulators. This leads to the problem that dielectric function or bandgap structure of these materials cannot be determined correctly if these effects are not removed. In this work we present a solution to this dilemma. We demonstrate that energy-loss function and real part of inverse complex dielectric function can be retrieved from raw data of VEELS. Based on the calculated example of Si, the limitation of our approach is discussed. We believe that our approach represents an improvement over previous procedures and has a broad prospect for applications. The detailed description will be published in Ultramicroscopy

Cite As

Qingping Meng (2022). Retrieving the energy-loss function from VEELS (, MATLAB Central File Exchange. Retrieved .

MATLAB Release Compatibility
Created with R2018a
Compatible with any release
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Modified Version/1- Original codes

Modified Version/2- Code for only extracting epsilon

Modified Version/3- Codes for Cerenkov and surface loss